DocumentCode :
1494577
Title :
Effects of current spreading on the performance of GaN-based light-emitting diodes
Author :
Kim, Hyunsoo ; Park, Seong-Ju ; Hwang, Hyunsang
Author_Institution :
Dept. of Mater. Sci. & Eng., Kwangju Inst. of Sci. & Technol., South Korea
Volume :
48
Issue :
6
fYear :
2001
fDate :
6/1/2001 12:00:00 AM
Firstpage :
1065
Lastpage :
1069
Abstract :
Effects of current spreading on the performance of multiple quantum well (MQW) GaN/InGaN light-emitting diodes (LEDs) were investigated. For the theoretical prediction of device performance, we developed a model using two device-design parameters, which consist of the applied current density and the effective length for the lateral current path. A comparison of the theoretical and experimental results clearly showed that the reliability characteristics and the optical efficiency of device are heavily dependent on the applied current density. In addition, the effective length for the lateral current path was found to have a profound effect on the uniform current spreading. Based on these findings, an ideal geometrical design of the highly efficient LED is proposed
Keywords :
III-V semiconductors; current density; gallium compounds; indium compounds; light emitting diodes; quantum well devices; semiconductor device reliability; GaN-InGaN; applied current density; device performance; device-design parameters; ideal geometrical design; lateral current path; light-emitting diodes; model; optical efficiency; reliability characteristics; uniform current spreading; Conductivity; Current density; Gallium nitride; Light emitting diodes; Optical devices; Optical materials; Predictive models; Quantum well devices; Reliability theory; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.925227
Filename :
925227
Link To Document :
بازگشت