• DocumentCode
    1494581
  • Title

    Detectors of Gamma Rays and Alpha Particles Based on Ta-Doped InP Converted to the Semi-Insulating State by Annealing

  • Author

    Zdansky, Karel ; Gorodynskyy, Vladyslav ; Pekarek, Ladislav

  • Author_Institution
    Inst. of Photonics & Electron., Acad. of Sci. of the Czech Republic, Prague, Czech Republic
  • Volume
    56
  • Issue
    5
  • fYear
    2009
  • Firstpage
    2997
  • Lastpage
    3001
  • Abstract
    InP crystals were synthesized with a Ta admixture grown by the Czochralski technique, and wafers cut from the grown crystals were converted to the SI state by high-temperature annealing. The good detection performance of such material-based detectors has been tested with alpha-particles from a 241Am source (5.48 MeV). The charge collection efficiency (CCE) of 84% and relative energy resolution at full width at half maximum (FWHM) of 5% were obtained at room temperature 295 K (RT). Low-energy gamma-photons of 122 keV from a 57Co source and gamma-photons from a 137Cs source were detected at 242 K, 272 K, and 295 K, respectively. The values of CCE 88% and FWHM 16 keV of 122 keV photons and CCE 87% and FWHM 48 keV of gamma-photons of 662 keV were obtained at reduced temperatures. A pulse-height spectrum of 662 keV gamma-photons registered at room temperature is also shown in this work.
  • Keywords
    III-V semiconductors; alpha-particle detection; annealing; crystal growth from melt; doping profiles; gamma-ray detection; high-temperature effects; indium compounds; semiconductor counters; semiconductor growth; tantalum; 137Cs source; 241Am source; 57Co source; Czochralski technique; InP:Ta; alpha particle detector; charge collection efficiency; crystal growth; doping; electron volt energy 122 keV; electron volt energy 662 keV; gamma ray detector; high-temperature annealing; low-energy gamma-photons; pulse-height spectrum; relative energy resolution; semiinsulating state; temperature 242 K; temperature 272 K; temperature 293 K to 298 K; temperature 295 K; Alpha particles; Annealing; Crystals; Energy resolution; Gamma ray detection; Gamma ray detectors; Gamma rays; Indium phosphide; Materials testing; Temperature; Gamma-ray detectors; indium phosphide devices; particle detectors; semiconductor radiation detectors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2027902
  • Filename
    5280509