• DocumentCode
    1494762
  • Title

    On the iterative schemes to obtain base doping profiles for reducing base transit time in a bipolar transistor

  • Author

    Kumar, M. Jagadesh ; Patri, Vijay S.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, India
  • Volume
    48
  • Issue
    6
  • fYear
    2001
  • fDate
    6/1/2001 12:00:00 AM
  • Firstpage
    1222
  • Lastpage
    1224
  • Abstract
    This paper shows that base doping profiles obtained using any iterative scheme for reducing the base transit time τb in bipolar transistors for a given neutral base width must take into account the heavy doping effects implicitly. Comparing our results with those reported earlier, we demonstrate that if the heavy doping effects are not implicitly included in the iterative scheme it will result in a completely different base doping profile leading to an overestimation of base transit time and underestimation of base resistance
  • Keywords
    bipolar transistors; doping profiles; heavily doped semiconductors; iterative methods; base doping profile; base doping profiles; base resistance; base transit time; bipolar transistor; heavy doping effects; iterative schemes; neutral base width; Bipolar transistors; Delay effects; Digital signal processing; Doping profiles; Electric resistance; Frequency; Instruments; Photonic band gap; Semiconductor process modeling; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.925251
  • Filename
    925251