DocumentCode :
1494818
Title :
On an Electroless Plating (EP)-Based Pd/AlGaN/GaN Heterostructure Field-Effect Transistor (HFET)-Type Hydrogen Gas Sensor
Author :
Huang, Chien-Chang ; Chen, Huey-Ing ; Chen, Tai-You ; Hsu, Chi-Shiang ; Chen, Chun-Chia ; Chou, Po-Cheng ; Liou, Jian-Kai ; Liu, Wen-Chau
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
Volume :
33
Issue :
6
fYear :
2012
fDate :
6/1/2012 12:00:00 AM
Firstpage :
788
Lastpage :
790
Abstract :
A Pd/AlGaN/GaN heterostructure field-effect transistor (HFET)-type hydrogen gas sensor, based on the sensitization, activation, and electroless plating (EP) deposition processes, is fabricated and studied. Due to the used sensitization and activation approaches, a dense and uniform EP seed layer could be achieved. Good dc and microwave characteristics, including the higher turn-on voltage, lower reverse leakage current, improved thermal stability of drain current, enhanced unity current gain cutoff frequency, and maximum oscillation frequency, are obtained for a 1-m-gate-length device. Moreover, the significant hydrogen gas sensing performance, such as larger drain current variation and higher hydrogen detection sensitivity, are found under 1% and 5 ppm H2/air ambiences, respectively. Consequently, the studied EP-based Pd/AlGaN/GaN HFET gives the promise for high-performance electronic device and hydrogen gas sensor applications.
Keywords :
aluminium compounds; electrodeposition; gallium compounds; gas sensors; high electron mobility transistors; hydrogen; palladium; semiconductor device manufacture; thermal stability; H; Pd-AlGaN-GaN; activation processes; drain current; electroless plating deposition processes; heterostructure field-effect transistor-type gas sensor; high-performance electronic device; higher turn-on voltage; lower reverse leakage current; maximum oscillation frequency; sensitization processes; size 1 m; thermal stability; unity current gain cutoff frequency; Aluminum gallium nitride; Gallium nitride; Gas detectors; HEMTs; Logic gates; MODFETs; Temperature measurement; Activation; electroless plating (EP); heterostructure field-effect transistor (HFET); hydrogen; sensitization; sensor;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2012.2190032
Filename :
6183459
Link To Document :
بازگشت