DocumentCode
1494966
Title
Prospects for proximity effect superconducting FETs
Author
Kleinsasser, A.W. ; Jackson, T.N.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
25
Issue
2
fYear
1989
fDate
3/1/1989 12:00:00 AM
Firstpage
1274
Lastpage
1277
Abstract
The authors address the question of how a JOFET (Josephson field effect transistor) works and whether or not a useful device of this type is feasible. They show that JOFETs represent a limiting case of normal FETs in which superconducting source and drain contacts result in zero channel resistance. This results in improved device characteristics, but does not have a major effect on speed or power dissipation. With conventional superconductors, the input and output voltage scales are incompatible, but the authors describe the extent to which this can be overcome by using high-temperature superconductors, making possible voltage gain exceeding unity. Device length and operating temperature are constrained by the natural length scale for the penetration of superconductivity into normal materials, so that submicrometer device dimensions and operating temperatures less than ~77 K are required. Silicon is effectively ruled out in favor of III-V materials for device operation above ~20 K
Keywords
Josephson effect; field effect transistors; high-temperature superconductors; proximity effect; superconducting junction devices; JOFET; Josephson field effect transistor; drain contacts; high-temperature superconductors; input voltage scale; operating temperature; output voltage scales; proximity effect superconducting FETs; source contacts; submicrometer device dimensions; voltage gain; zero channel resistance; Contact resistance; FETs; High temperature superconductors; III-V semiconductor materials; Power dissipation; Proximity effect; Silicon; Superconducting materials; Superconductivity; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.92528
Filename
92528
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