• DocumentCode
    1494966
  • Title

    Prospects for proximity effect superconducting FETs

  • Author

    Kleinsasser, A.W. ; Jackson, T.N.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    25
  • Issue
    2
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    1274
  • Lastpage
    1277
  • Abstract
    The authors address the question of how a JOFET (Josephson field effect transistor) works and whether or not a useful device of this type is feasible. They show that JOFETs represent a limiting case of normal FETs in which superconducting source and drain contacts result in zero channel resistance. This results in improved device characteristics, but does not have a major effect on speed or power dissipation. With conventional superconductors, the input and output voltage scales are incompatible, but the authors describe the extent to which this can be overcome by using high-temperature superconductors, making possible voltage gain exceeding unity. Device length and operating temperature are constrained by the natural length scale for the penetration of superconductivity into normal materials, so that submicrometer device dimensions and operating temperatures less than ~77 K are required. Silicon is effectively ruled out in favor of III-V materials for device operation above ~20 K
  • Keywords
    Josephson effect; field effect transistors; high-temperature superconductors; proximity effect; superconducting junction devices; JOFET; Josephson field effect transistor; drain contacts; high-temperature superconductors; input voltage scale; operating temperature; output voltage scales; proximity effect superconducting FETs; source contacts; submicrometer device dimensions; voltage gain; zero channel resistance; Contact resistance; FETs; High temperature superconductors; III-V semiconductor materials; Power dissipation; Proximity effect; Silicon; Superconducting materials; Superconductivity; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.92528
  • Filename
    92528