DocumentCode
1495106
Title
Rebuttal To: A Critique Of The Reliability-analysis-center Failure-rate-model For Plastic Encapsulated Microcircuits
Author
Denson, William K.
Author_Institution
Reliability Analysis Center, Rome
Volume
47
Issue
4
fYear
1998
Firstpage
419
Lastpage
424
Keywords
Costs; Failure analysis; Feedback; Life estimation; Performance analysis; Physics; Plastics; Predictive models; Reliability engineering; Uncertainty;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1998.756084
Filename
756084
Link To Document