• DocumentCode
    1495141
  • Title

    Spurious exponentiality observed when incorrectly fitting a distribution to nonstationary data

  • Author

    Ascher, Harold E. ; Hansen, Christian K.

  • Author_Institution
    Harold E. Ascher & Associates, Potomac, USA
  • Volume
    47
  • Issue
    4
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    451
  • Lastpage
    459
  • Abstract
    Failure data for a repairable system can be represented either by a set of chronologically ordered arrival times at which the system failed, or by a set of interarrival times defined as the times observed between successive failures (ignoring repair times in both cases). The two representations are mathematically equivalent if the chronological order of the interarrival times is maintained. Methods aimed at describing the distribution of the observed interarrival times are meaningful only if the interarrival times are identically distributed. In all other cases, such analyses are meaningless and often result in maximally misleading impressions about the system behavior, as demonstrated here by several examples. That is, when the information in the chronological order of interarrival times is ignored, they often appear spuriously exponential, leading to the impression that the system can be modeled using a homogeneous Poisson process. Misunderstandings of this nature can be avoided by applying an appropriate test for trend before attempting to fit a distribution to the interarrival times. If evidence of trend is determined, then a nonstationary model such as the nonhomogeneous Poisson process should be fitted using the chronologically ordered data
  • Keywords
    Poisson distribution; failure analysis; maintenance engineering; chronologically ordered arrival times; chronologically ordered data; failure data; homogeneous Poisson process; interarrival times; nonhomogeneous Poisson process; nonstationary data distribution fitting; renewal process; repairable system; spurious exponentiality; successive failures; trend test; Data analysis; Distribution functions; Exponential distribution; Hazards; Histograms; History; Mathematical model; Random variables; Sequential analysis; System testing;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.756089
  • Filename
    756089