Title :
Nonlinear transformer model for circuit simulation
Author :
Chan, John H. ; Vladimirescu, Andrei ; Gao, Xiao-Chun ; Liebmann, Peter ; Valainis, John
Author_Institution :
Hong Kong Univ., Kowloon, Hong Kong
fDate :
4/1/1991 12:00:00 AM
Abstract :
A transformer model which consists of a nonlinear core with hysteresis and multiple windings is described as implemented in DSPICE. In contrast to previous implementations, the nonlinear behavior of the new model is described by continuous piecewise-hyperbolic functions characterized by three parameters. These parameters are the same as parameters previously published in the literature. A loop-traversing algorithm has been implemented which avoids discontinuities and eliminates both nonconvergence problems and the occurrence of erroneous voltage spikes during time-domain simulation. In the large-signal time-domain analysis the frequency-dependent eddy current losses in the core and wire losses are modeled. Additional effects, such as wire skin effect and temperature dependence, are also included. In the small-signal AC analysis the transformer is modeled as frequency-dependent lossy mutual inductors. For both analyses, the air gap and the elated fringe field effect are modeled by extending the magnetic path length of the core appropriately
Keywords :
circuit analysis computing; digital simulation; eddy current losses; magnetic hysteresis; skin effect; time-domain analysis; transformers; DSPICE; air gap; circuit simulation; continuous piecewise-hyperbolic functions; frequency-dependent eddy current losses; frequency-dependent lossy mutual inductors; hysteresis; large-signal time-domain analysis; loop-traversing algorithm; multiple windings; nonlinear core; small-signal AC analysis; temperature dependence; transformer model; wire losses; wire skin effect; Circuit simulation; Eddy currents; Frequency; Magnetic analysis; Magnetic cores; Magnetic hysteresis; Skin effect; Time domain analysis; Transformer cores; Wire;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on