DocumentCode :
1495405
Title :
A tool for hierarchical test generation
Author :
Krüger, Gerd
Author_Institution :
Nixdorf Comp. AG, Paderborn, Germany
Volume :
10
Issue :
4
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
519
Lastpage :
524
Abstract :
An extended system MSST (MIMOLA software system test generator), and its algorithms for automatic test generation are presented. In a hierarchical, mixed-level approach (from gate to system level) test patterns for sequential circuits and test programs for external testing or self-testing (diagnostics) of microprocessor boards or processor systems can be generated automatically. In a complete hierarchy lower bounds for test coverage are easily computable. The MIMOLA design system (including MSST) has been installed on VAX, APOLLO, SUN, and several other host machines. Several production line test applications show good results
Keywords :
automatic testing; circuit CAD; logic CAD; logic testing; sequential circuits; APOLLO; MIMOLA design system; MSST; SUN; VAX; automatic test generation; external testing; hierarchical test generation; microprocessor boards; mixed level test patterns; processor systems; self-testing; sequential circuits; software system test generator; test programs; Automatic testing; Built-in self-test; Circuit testing; Microprocessors; Sequential analysis; Sequential circuits; Software algorithms; Software systems; Software testing; System testing;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.75635
Filename :
75635
Link To Document :
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