• DocumentCode
    1495482
  • Title

    Exploiting Parity Computation Latency for On-Chip Crosstalk Reduction

  • Author

    Fu, Bo ; Ampadu, Paul

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY, USA
  • Volume
    57
  • Issue
    5
  • fYear
    2010
  • fDate
    5/1/2010 12:00:00 AM
  • Firstpage
    399
  • Lastpage
    403
  • Abstract
    This brief provides an efficient method to address both logic errors and crosstalk-induced delay variations. In particular, the inherent skew resulting from parity generation is exploited to ensure that no two adjacent wires switch in opposite directions simultaneously, thereby reducing worst-case on-chip capacitive coupling. Data and parity-check bits are mapped to link driver registers, which are triggered by alternating clock phases. The proposed method reduces worst-case link delay by 25% for a 5 mm link, as compared to a conventional skewed transition approach. Compared with other solutions that simultaneously handle logic and delay errors, the proposed method reduces delay uncertainty by up to 24%, improves residual word error probability by 2.5×, requires fewer wires, and achieves up to 45% and 32% reductions in area and energy consumption, respectively.
  • Keywords
    crosstalk; driver circuits; error correction codes; error statistics; integrated circuit interconnections; adjacent wires switch; crosstalk-induced delay variations; delay uncertainty; energy consumption; error-control coding; link delay; link driver registers; logic errors; on-chip crosstalk reduction; on-chip interconnects; parity-check bits; residual word error probability; worst-case on-chip capacitive coupling; Clocks; Crosstalk; Delay; Energy consumption; Error probability; Logic; Parity check codes; Switches; Uncertainty; Wires; Crosstalk avoidance; error-control coding (ECC); on-chip interconnects; reliability; skewed transition;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2010.2043472
  • Filename
    5466569