DocumentCode :
1495580
Title :
Experimental analysis of transient current testing based on charge observation
Author :
Segura, J. ; De Paul, I. ; Roca, M. ; Isern, E. ; Hawkins, C.F.
Author_Institution :
Phys. Dept., Balearic Is. Univ., Palma de Mallorca, Spain
Volume :
35
Issue :
6
fYear :
1999
fDate :
3/18/1999 12:00:00 AM
Firstpage :
441
Lastpage :
443
Abstract :
A test technique that uses the charge driven into the circuit computed from the transient power supply current is analysed. Experimental data are provided concerning the merits of this technique and its effectiveness at detecting open defects that do not increase the power consumption (those that cannot be detected with IDDQ)
Keywords :
CMOS digital integrated circuits; integrated circuit testing; logic testing; transient analysis; CMOS; IC testing; charge observation; digital ICs; logic testing; open defects; power consumption; transient current testing;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19990359
Filename :
756378
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1495580
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