• DocumentCode
    1495580
  • Title

    Experimental analysis of transient current testing based on charge observation

  • Author

    Segura, J. ; De Paul, I. ; Roca, M. ; Isern, E. ; Hawkins, C.F.

  • Author_Institution
    Phys. Dept., Balearic Is. Univ., Palma de Mallorca, Spain
  • Volume
    35
  • Issue
    6
  • fYear
    1999
  • fDate
    3/18/1999 12:00:00 AM
  • Firstpage
    441
  • Lastpage
    443
  • Abstract
    A test technique that uses the charge driven into the circuit computed from the transient power supply current is analysed. Experimental data are provided concerning the merits of this technique and its effectiveness at detecting open defects that do not increase the power consumption (those that cannot be detected with IDDQ)
  • Keywords
    CMOS digital integrated circuits; integrated circuit testing; logic testing; transient analysis; CMOS; IC testing; charge observation; digital ICs; logic testing; open defects; power consumption; transient current testing;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19990359
  • Filename
    756378
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1495580