Title :
Low turnoff loss reverse-conducting IGBT with double n-p-n electron extraction paths
Author :
Jiang, Hongbo ; Zhang, Boming ; Chen, Weijie ; Qiao, Ming ; Li, Zuyi ; Liu, Cong ; Rao, Z. ; Dong, Binhong
Author_Institution :
State Key Lab. of Electron. Thin Film & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
A low turnoff loss snapback-free reverse-conducting insulated-gate bipolar transistor (RC-IGBT) with a novel collector structure is demonstrated. The n-collector is partially enclosed by a floating p-layer (p-float) which acts as a barrier for electrons at low current in the forward conduction state and contributes to the snapback-free forward conduction characteristics. The p-float makes the proposed device feature double n-p-n electron extraction paths, the n-drift/p- float/n-collector (n-p-nl, n-drift is emitter) and the n-buffer/p-float/ n-collector (n-p-n2, n-buffer is emitter), both of which can be activated during turnoff. As numerical simulations show, the two n-p-n extraction paths, especially n-p-n2 which is more effective than n-p-nl, are favourable to the ultra-low turnoff loss.
Keywords :
insulated gate bipolar transistors; numerical analysis; RC-IGBT; double n-p-n electron extraction paths; forward conduction state; low turnoff loss reverse-conducting insulated-gate bipolar transistor; n-drift-p- float-n-collector; numerical simulations; snapback-free forward conduction characteristics; snapback-free reverse-conducting insulated-gate bipolar transistor;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2012.0260