Title :
MM wave quasioptical SIS mixers
Author :
Hu, Qing ; Mear, C.A. ; Richards, P.L. ; Lloyd, F.L.
Author_Institution :
Dept. of Phys., California Univ., Berkeley, CA, USA
fDate :
3/1/1989 12:00:00 AM
Abstract :
The authors have tested the performance of planar SIS (superconductor-insulator-superconductor) mixers with log-periodic antennas at near millimeter and submillimeter wave frequencies from 90 to 360 GHz. The large ωRNC product (~10 at 90 GHz) of the Nb/NbOx/Pb-In-Au junctions requires an integrated inductive tuning element to resonate the junction capacitance at the operating frequencies. Two types of integrated tuning element were used which were designed with the aid of measurements using a Fourier transform spectrometer. Preliminary results indicate that the tuning elements can give very good mixer performance up to at least 200 GHz. An inductive wire in parallel with a 5-junction array gives a minimum mixer noise temperature of 115 K (DSB) at 90 GHz with a FWHM (full width at half maximum) bandwidth of 8 GHz. An open-ended microstrip stub in parallel with a single junction gives minimum mixer noise temperatures at 150 and 200 K (DSB) near 90 and 180 GHz with FWHM bandwidths of 4 and 3 GHz, respectively. The relatively high mixer noise temperatures compared to those of waveguide SIS mixers in a similar frequency range are attributed mainly to the losses in the optical system
Keywords :
equivalent circuits; mixers (circuits); solid-state microwave circuits; submillimetre wave devices; superconducting junction devices; tuning; 90 to 360 GHz; EHF; MM wave; Nb-NbOx-PbInAu junctions; THF; integrated inductive tuning element; junction capacitance; log-periodic antennas; microwave circuits; millimetre wave frequencies; mixer noise temperature; open-ended microstrip stub; planar type; quasioptical SIS mixers; submillimeter wave frequencies; superconductor-insulator-superconductor; Bandwidth; Frequency; Log periodic antennas; Optical noise; Optical waveguides; Superconducting device noise; Superconducting devices; Temperature; Testing; Tuning;
Journal_Title :
Magnetics, IEEE Transactions on