Title :
Automatic nonlinear auto-tuning method for Hammerstein modeling of electrical drives
Author :
Balestrino, Aldo ; Landi, Alberto ; Ould-Zmirli, Mohamed ; Sani, Luca
Author_Institution :
Dipt. di Sistemi Elettrici e Automazione, Pisa Univ., Italy
fDate :
6/1/2001 12:00:00 AM
Abstract :
Accurate modeling of electrical drives for online testing is a relevant problem, because of their nonlinear behavior. Efficient modeling for simulation, performance evaluation, and testing must consider accurate as well as simple models. This paper proposes the application of auto-tune methods to identify equivalent Hammerstein models, where the nonlinear process is approximated by a static nonlinear element followed by a linear dynamic second or third-order model. The effectiveness of the presented procedure is first verified by simulation results, showing that Hammerstein models overcome the limitations inherent to small-signal linearizations. A standard implementation of such technique considers a relay adjustment for attempts in a heuristic way. In this paper, two innovations are proposed: the relay adjustment is automatically shifted and the method is applied for complex electric drives. Experimental results are shown in the case of a drive constituted by a DC/AC inverter supplying a single-phase induction motor and of a step-down chopper
Keywords :
AC motor drives; DC-AC power convertors; DC-DC power convertors; invertors; machine theory; DC-DC buck converter; DC/AC inverter; Hammerstein modeling; automatic nonlinear auto-tuning method; dynamic third-order model; electrical drives; linear dynamic second-order model; nonlinear behavior; nonlinear process; online testing; performance evaluation; relay adjustment; simulation; single-phase induction motor; small-signal linearizations; static nonlinear element; step-down chopper; testing; Autoregressive processes; Choppers; Induction motors; Nonlinear systems; Pulse width modulation; Pulse width modulation converters; Pulse width modulation inverters; Relays; Technological innovation; Testing;
Journal_Title :
Industrial Electronics, IEEE Transactions on