DocumentCode :
1496334
Title :
Broadband Root-Mean-Square Detector in CMOS for On-Chip Measurements of Millimeter-Wave Voltages
Author :
Lee, Chuan ; Choi, Wooyeol ; Han, Ruonan ; Shichijo, Hisashi ; Kenneth, K.O.
Author_Institution :
Dept. of Electr. Eng., Univ. of Texas at Dallas, Dallas, TX, USA
Volume :
33
Issue :
6
fYear :
2012
fDate :
6/1/2012 12:00:00 AM
Firstpage :
752
Lastpage :
754
Abstract :
A root-mean-square Schottky diode detector for estimating millimeter-wave (80-110 GHz) signal voltage using dc or low-frequency measurements for debugging and self-testing is demonstrated. The detector is realized in a 45-nm CMOS process without any process modifications. The detector gain at 30-mVrms input voltage is 11 V-1 . The insertion loss is less than 0.2 dB, and the flatness of the detector gain over 80-110 GHz is 15%. The input dynamic range is greater than 29 dB, and the size of the detector including the filter capacitor is 340 m2.
Keywords :
CMOS integrated circuits; Schottky diodes; millimetre wave measurement; voltage measurement; CMOS process; broadband root-mean-square detector; dc measurements; frequency 80 GHz to 110 GHz; low-frequency measurements; millimeter-wave signal voltage; millimeter-wave voltages; on-chip measurements; root-mean-square Schottky diode detector; size 45 nm; CMOS integrated circuits; Detectors; Gain; Millimeter wave measurements; Schottky diodes; Semiconductor device measurement; Voltage measurement; Detector; Schottky diodes; millimeter-wave voltage measurement;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2012.2190258
Filename :
6184276
Link To Document :
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