Title :
Mutual locking, chaos and devils staircase in two Josephson tunnel junctions with a common resistive shunt
Author :
Jensen, H.D. ; Larsen, A. ; Mygind, J. ; Levinsen, M.T.
Author_Institution :
Danish Inst. of Fundamental Metrol., Lyngby, Denmark
fDate :
3/1/1989 12:00:00 AM
Abstract :
The authors studied the phase-locking in a pair of individually biased, resistively and capacitively shunted Josephson junctions, coupled by a common resistive or capacitive shunt, on an analog computer. Under certain conditions, locking is found to occur at all rational frequency ratios. A critical line is found in parameter space along which the steps form a complete devil´s staircase having a fractal dimension of 0.87. Beyond the critical line bifurcations occur on all steps following the Feigenbaum sequence to chaos. The Feigenbaum constants are recovered to a fair accuracy. Preliminary experiments with two Josephson tunnel junctions shunted on the chip by a gold-indium film are discussed
Keywords :
Josephson effect; chaos; equivalent circuits; stability; superconducting junction devices; Au-In film shunt; AuIn; Feigenbaum sequence; Josephson tunnel junctions; Pb alloy electrodes; bifurcations; capacitive shunt; chaos; circuit models; common resistive shunt; critical line; devils staircase; fractal dimension; individually-biased junction pair; mutual locking; parameter space; phase-locking; superconducting junctions; Analog computers; Bifurcation; Capacitance; Chaos; Coupling circuits; Critical current; Fractals; Frequency; Josephson junctions; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on