DocumentCode :
1496444
Title :
Characterization of a Wideband Digitizer for Power Measurements up to 1 MHz
Author :
Rietveld, Gert ; Zhao, Dongsheng ; Kramer, Charlotte ; Houtzager, Ernest ; Kristensen, Orla ; De Leffe, Cyrille ; Lippert, Torsten
Author_Institution :
Van Swinden Lab., Nat. Metrol. Inst. of Netherlands, Delft, Netherlands
Volume :
60
Issue :
7
fYear :
2011
fDate :
7/1/2011 12:00:00 AM
Firstpage :
2195
Lastpage :
2201
Abstract :
A two-channel high-speed digitizer has been extensively characterized in the frequency range of 50 Hz-1 MHz. Measurements involved alternating-current (ac) flatness, phase, linearity, input impedance, and the effects of direct-current offsets, temperature, and an internal self-calibration routine. A digital antialiasing filter inside the digitizer negatively affects ac flatness in the low-frequency region. An inverse compensation filter has been designed and applied, which improves frequency response with a factor of 25-60 and makes it flat within 25 μV/V up to 100 kHz and within 100 μV/V up to 1 MHz. The phase difference between the two channels can be modeled by a constant time delay between the two channels, which for the 2- Vpp range equals (250 ± 30) ps. The overall results of the characterization indicate that the digitizer can be applied in wideband power measurements under practical circumstances with (k = 1) uncertainty contributions of not more than 70 and 400 μW/VA at 10 kHz and 1 MHz, respectively. This uncertainty excludes loading effects, which are significant at frequencies above 100 kHz. At low frequencies, up to three times lower uncertainty are achieved when the digitizer is calibrated at the signal level and temperature at which it is subsequently used.
Keywords :
analogue-digital conversion; calibration; compensation; digital filters; electric impedance; frequency response; measurement uncertainty; power measurement; alternating-current flatness; constant time delay; digital antialiasing filter; direct-current offset; frequency 50 Hz to 1 MHz; frequency response; input impedance; internal self-calibration routine; inverse compensation filter; loading effects; measurement uncertainty; phase difference; temperature effect; two-channel high-speed digitizer; wideband digitizer; wideband power measurement; Frequency measurement; Frequency response; Phase measurement; Power measurement; Temperature measurement; Uncertainty; Wideband; Digital filters; Digital–analog conversion; digitizer; frequency response; phase measurement; power measurement; wideband power;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2011.2117330
Filename :
5751689
Link To Document :
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