Title :
Active Testing for Face Detection and Localization
Author :
Sznitman, Raphael ; Jedynak, Bruno
Author_Institution :
Dept. of Comput. Sci., Johns Hopkins Univ., Baltimore, MD, USA
Abstract :
We provide a novel search technique which uses a hierarchical model and a mutual information gain heuristic to efficiently prune the search space when localizing faces in images. We show exponential gains in computation over traditional sliding window approaches, while keeping similar performance levels.
Keywords :
face recognition; search problems; active testing; face detection; face localization; hierarchical model; mutual information gain heuristic; search technique; Active testing; coarse-to-fine search; face detection; face localization.; visual search; Algorithms; Artificial Intelligence; Face; Humans; Image Processing, Computer-Assisted; Pattern Recognition, Automated;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2010.106
