• DocumentCode
    1496536
  • Title

    Automated Derivation of Application-Specific Error Detectors Using Dynamic Analysis

  • Author

    Pattabiraman, Karthik ; Saggese, Giacinto Paolo ; Chen, Daniel ; Kalbarczyk, Zbigniew ; Iyer, Ravishakar K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
  • Volume
    8
  • Issue
    5
  • fYear
    2011
  • Firstpage
    640
  • Lastpage
    655
  • Abstract
    This paper proposes a novel technique for preventing a wide range of data errors from corrupting the execution of applications. The proposed technique enables automated derivation of fine-grained, application-specific error detectors based on dynamic traces of application execution. The technique derives a set of error detectors using rule-based templates to maximize the error detection coverage for the application. A probability model is developed to guide the choice of the templates and their parameters for error-detection. The paper also presents an automatic framework for synthesizing the set of detectors in hardware to enable low-overhead, runtime checking of the application. The coverage of the derived detectors is evaluated using fault-injection experiments, while the performance and area overheads of the detectors are evaluated by synthesizing them on reconfigurable hardware.
  • Keywords
    field programmable gate arrays; probability; system monitoring; application execution; application-specific error detectors; data errors; dynamic analysis; fault-injection experiments; probability model; reconfigurable hardware; rule-based templates; Computer crashes; Detectors; Error correction codes; Fault detection; Field programmable gate arrays; Hardware; Programming profession; Protection; Registers; Runtime; Data errors; FPGA hardware.; critical variables; dynamic execution; likely invariants;
  • fLanguage
    English
  • Journal_Title
    Dependable and Secure Computing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1545-5971
  • Type

    jour

  • DOI
    10.1109/TDSC.2010.19
  • Filename
    5467091