• DocumentCode
    1496632
  • Title

    Principle Hessian Direction-Based Parameter Reduction for Interconnect Networks With Process Variation

  • Author

    Mitev, Alex ; Marefat, Michael ; Ma, Dongsheng ; Wang, Janet Meiling

  • Author_Institution
    Univ. of Arizona at Tucson, Tucson, AZ, USA
  • Volume
    18
  • Issue
    9
  • fYear
    2010
  • Firstpage
    1337
  • Lastpage
    1347
  • Abstract
    As CMOS technology enters the nanometer regime, the increasing process variation is bringing manifest impact on circuit performance. To accurately consider both global and local process variations, a large number of random variables (or parameters) have to be incorporated into circuit models. This in turn raises the complexity of the circuit models. In this paper, we propose a principle Hessian direction-based parameter-reduction approach. This new approach relies on the impact of each parameter on circuit performance to decide whether keeping or reducing the parameter. Compared with the existing principle component analysis method, this performance based property provides us a significantly smaller set of parameters after reduction. The experimental results also support our conclusions. In interconnect cases, the proposed method reduces 70% of parameters. In some cases, for example, the mesh circuit in the current paper, the new approach leads to an 85% reduction. We also tested ISCAS benchmarks. In all cases, an average of 53% of reduction is observed with less than 3% error in the mean value and less than 8% error in the variation.
  • Keywords
    CMOS integrated circuits; Hessian matrices; integrated circuit interconnections; CMOS technology; circuit model; circuit performance; interconnect networks; mesh circuit; principle Hessian direction-based parameter reduction; principle component analysis; process variation; CMOS process; CMOS technology; Circuit analysis; Circuit optimization; Circuit testing; Delay; Integrated circuit interconnections; Performance analysis; Random variables; Semiconductor device modeling; Principle Hessian directions (PHDs); process variation; timing analysis;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2009.2024340
  • Filename
    5282514