DocumentCode :
1496843
Title :
Integer-N PLLs Verification Methodology: Large Signal Steady State and Noise Analysis
Author :
Wang, Bo ; Ngoya, Edouard
Author_Institution :
Shenzhen Grad. Sch., Key Lab. of Integrated Microsyst., Peking Univ., Shenzhen, China
Volume :
59
Issue :
11
fYear :
2012
Firstpage :
2738
Lastpage :
2748
Abstract :
The need for accurate and fast verification of the phase locked loop (PLL) circuits is a designers´ important concern before the chip tape-out. This paper covers two major PLL characteristics for circuit verification: steady-state response and phase noise. A new simulation methodology is proposed and comprehensively described. It is general purpose and can be implemented within the framework of all commercial radio frequency integrated circuit (RFIC) simulation tools. By using the new algorithm, we succeed in predicting integer-N PLL´s characteristics with the same precision as the conventional brute-force transistor-level simulation while spending much less time and computer memory. It is composed of two stages, a hierarchical analysis algorithm for the steady state response calculation and a bottom-up behavioral modeling strategy for the phase noise analysis that accurately accounts for the non-idealities in all PLL blocks.
Keywords :
phase locked loops; phase noise; radiofrequency integrated circuits; RFIC simulation tools; bottom-up behavioral modeling strategy; brute-force transistor-level simulation; circuit verification; computer memory; hierarchical analysis algorithm; integer-N PLL verification methodology; large signal steady state response analysis; phase locked loop circuit; phase noise analysis; radiofrequency integrated circuit simulation tools; Impedance; Integrated circuit modeling; Load modeling; Noise; Phase locked loops; Steady-state; Voltage-controlled oscillators; Conversion matrix; harmonic balance; phase noise; phase-locked loop; power spectral density; spur; steady state; time-shooting;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2012.2190677
Filename :
6184349
Link To Document :
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