DocumentCode :
1497206
Title :
High-frequency measurements conference draws large attendance in Washington, D.C.
Volume :
68
Issue :
3
fYear :
1949
fDate :
3/1/1949 12:00:00 AM
Firstpage :
261
Lastpage :
262
Abstract :
The conference on high-frequency measurements, held in Washington, D. C, January 10–12, 1949, was one of the most successful conferences held thus far. Fifth of the new type of AIEE meetings known as “technical conferences” (EE, Feb ´48, p 189), it drew an attendance of some 584 high-frequency measurements specialists who heard papers on all phases of this interesting field. The gathering was the first of its kind to be held on a national basis where the topics were devoted solely to the field of high-frequency measurements.
Keywords :
Companies; Electrical engineering; Frequency measurement; Inspection; Laboratories; Microwave measurements; NIST;
fLanguage :
English
Journal_Title :
Electrical Engineering
Publisher :
ieee
ISSN :
0095-9197
Type :
jour
DOI :
10.1109/EE.1949.6444678
Filename :
6444678
Link To Document :
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