Title :
Coherent reflectometry of optical fiber amplifiers
Author :
von der Weid, J.P. ; Passy, R. ; Gisin, N.
Author_Institution :
Centre for Telecommun. Studies, Pontificia Univ. Catolica do Rio de Janeiro, Brazil
Abstract :
The reflectivity of commercially available erbium-doped fiber amplifiers (EDFAs) was measured with coherent optical frequency domain reflectometry (C-OFDR). Reflections at the output isolator as well as the distributed gain along the erbium-doped fiber could be observed thanks to the high amplified spontaneous emission (ASE) rejection due to the coherent detection. Gain figures obtained with the OFDR technique are in good agreement with single-pass direct gain measurements.
Keywords :
erbium; fibre lasers; light coherence; optical communication equipment; optical isolators; optical testing; reflectometry; superradiance; ASE rejection; EDFAs; OFDR technique; coherent detection; coherent optical frequency domain reflectometry; coherent reflectometry; commercially available erbium-doped fiber amplifier reflectivity; distributed gain; gain figures; high amplified spontaneous emission; optical communications equipment; optical fiber amplifiers; optical testing; output isolator reflections; single-pass direct gain measurements; Erbium-doped fiber amplifier; Frequency domain analysis; Frequency measurement; Isolators; Optical fiber amplifiers; Optical fibers; Optical reflection; Reflectivity; Reflectometry; Stimulated emission;
Journal_Title :
Photonics Technology Letters, IEEE
