DocumentCode
1497579
Title
Fault Tolerant Network on Chip Switching With Graceful Performance Degradation
Author
Kohler, Adán ; Schley, Gert ; Radetzki, Martin
Author_Institution
Univ. of Stuttgart, Stuttgart, Germany
Volume
29
Issue
6
fYear
2010
fDate
6/1/2010 12:00:00 AM
Firstpage
883
Lastpage
896
Abstract
The structural redundancy inherent to on-chip interconnection networks [networks on chip (NoC)] can be exploited by adaptive routing algorithms in order to provide connectivity even if network components are out of service due to faults, which will appear at an increasing rate with future chip technology nodes. This paper is based on a new, fine-grained functional fault model and a corresponding distributed fault diagnosis method that facilitate determining the fault status of individual NoC switches and their adjacent communication links. Whereas previous work on network fault-tolerance assume switches to be either available or fully out of service, we present a novel adaptive routing algorithm that employs the remaining functionality of partly defective switches. Using diagnostic information, transient faults are handled with a retransmission scheme that avoids the latency penalty of end-to-end repeat requests. Thereby, graceful degradation of NoC communication performance can be achieved even under high failure rates.
Keywords
circuit reliability; circuit switching; fault diagnosis; fault tolerance; integrated circuit interconnections; network routing; network-on-chip; NoC; adaptive routing algorithm; distributed fault diagnosis; end-to-end repeat request; fault tolerance; fine-grained functional fault model; future chip technology; latency penalty; network on chip switching; on-chip interconnection networks; retransmission scheme; transient faults; Communication switching; Degradation; Delay; Fault diagnosis; Fault tolerance; Multiprocessor interconnection networks; Network-on-a-chip; Redundancy; Routing; Switches; Adaptive routing; graceful degradation; network fault tolerance; network on chip; online fault diagnosis;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2010.2048399
Filename
5467330
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