DocumentCode :
1497579
Title :
Fault Tolerant Network on Chip Switching With Graceful Performance Degradation
Author :
Kohler, Adán ; Schley, Gert ; Radetzki, Martin
Author_Institution :
Univ. of Stuttgart, Stuttgart, Germany
Volume :
29
Issue :
6
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
883
Lastpage :
896
Abstract :
The structural redundancy inherent to on-chip interconnection networks [networks on chip (NoC)] can be exploited by adaptive routing algorithms in order to provide connectivity even if network components are out of service due to faults, which will appear at an increasing rate with future chip technology nodes. This paper is based on a new, fine-grained functional fault model and a corresponding distributed fault diagnosis method that facilitate determining the fault status of individual NoC switches and their adjacent communication links. Whereas previous work on network fault-tolerance assume switches to be either available or fully out of service, we present a novel adaptive routing algorithm that employs the remaining functionality of partly defective switches. Using diagnostic information, transient faults are handled with a retransmission scheme that avoids the latency penalty of end-to-end repeat requests. Thereby, graceful degradation of NoC communication performance can be achieved even under high failure rates.
Keywords :
circuit reliability; circuit switching; fault diagnosis; fault tolerance; integrated circuit interconnections; network routing; network-on-chip; NoC; adaptive routing algorithm; distributed fault diagnosis; end-to-end repeat request; fault tolerance; fine-grained functional fault model; future chip technology; latency penalty; network on chip switching; on-chip interconnection networks; retransmission scheme; transient faults; Communication switching; Degradation; Delay; Fault diagnosis; Fault tolerance; Multiprocessor interconnection networks; Network-on-a-chip; Redundancy; Routing; Switches; Adaptive routing; graceful degradation; network fault tolerance; network on chip; online fault diagnosis;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2010.2048399
Filename :
5467330
Link To Document :
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