DocumentCode :
1497772
Title :
Using Magnetic and Optical Methods to Determine the Size and Characteristics of Nanoparticles Embedded in Oxide Semiconductors
Author :
Gehring, Gillian A. ; Blythe, Harry J. ; Feng, Qi ; Score, David S. ; Mokhtari, Abbas ; Alshammari, Marzook ; Al Qahtani, Mohammed S. ; Fox, A. Mark
Author_Institution :
Dept. of Phys. & Astron., Univ. of Sheffield, Sheffield, UK
Volume :
46
Issue :
6
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
1784
Lastpage :
1786
Abstract :
Films of oxides doped with transition metals are frequently believed to have magnetic inclusions. Magnetic methods to determine the amount of nanophases and their magnetic characteristics are described. The amount of the sample that is paramagnetic may also be measured. Optical methods are described and shown to be very powerful to determine which defects are also magnetic.
Keywords :
II-VI semiconductors; aluminium compounds; cobalt compounds; inclusions; magnetic anisotropy; magnetic impurities; magneto-optical effects; nanoparticles; paramagnetism; semiconductor thin films; wide band gap semiconductors; zinc compounds; Nanoparticles; Oxide Semiconductors; Zn1-x-yCoxAlyO; defects; magnetic anisotropy; magnetic inclusions; magnetization; magneto-optics; paramagnetic sample; pulsed laser deposition; thin films; Amorphous magnetic materials; Iron; Magnetic anisotropy; Magnetic semiconductors; Magnetization; Nanoparticles; Optical films; Paramagnetic materials; Perpendicular magnetic anisotropy; Temperature; Magnetization process; magneto-optics;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2010.2041196
Filename :
5467363
Link To Document :
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