Using Magnetic and Optical Methods to Determine the Size and Characteristics of Nanoparticles Embedded in Oxide Semiconductors

Author

Gehring, Gillian A. ; Blythe, Harry J. ; Feng, Qi ; Score, David S. ; Mokhtari, Abbas ; Alshammari, Marzook ; Al Qahtani, Mohammed S. ; Fox, A. Mark

Author_Institution

Dept. of Phys. & Astron., Univ. of Sheffield, Sheffield, UK

Volume

46

Issue

6

fYear

2010

fDate

6/1/2010 12:00:00 AM

Firstpage

1784

Lastpage

1786

Abstract

Films of oxides doped with transition metals are frequently believed to have magnetic inclusions. Magnetic methods to determine the amount of nanophases and their magnetic characteristics are described. The amount of the sample that is paramagnetic may also be measured. Optical methods are described and shown to be very powerful to determine which defects are also magnetic.

Keywords

II-VI semiconductors; aluminium compounds; cobalt compounds; inclusions; magnetic anisotropy; magnetic impurities; magneto-optical effects; nanoparticles; paramagnetism; semiconductor thin films; wide band gap semiconductors; zinc compounds; Nanoparticles; Oxide Semiconductors; Zn_1-x-yCo_xAl_yO; defects; magnetic anisotropy; magnetic inclusions; magnetization; magneto-optics; paramagnetic sample; pulsed laser deposition; thin films; Amorphous magnetic materials; Iron; Magnetic anisotropy; Magnetic semiconductors; Magnetization; Nanoparticles; Optical films; Paramagnetic materials; Perpendicular magnetic anisotropy; Temperature; Magnetization process; magneto-optics;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2010.2041196

Filename

5467363