• DocumentCode
    1497959
  • Title

    Understanding Noise Mechanism in Small Grain Size Perpendicular Thin Film Media

  • Author

    Wang, Yiming ; Zhu, Jian-Gang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    46
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    2391
  • Lastpage
    2393
  • Abstract
    One of the myths of today´s perpendicular thin film media is that there is no noticeable gain in medium signal-to-noise ratio (SNR) as grain size reduces below 8 nm. A recent experimental study shows that intergranular exchange coupling exhibits an exponential dependence of the oxide grain boundary thickness for the thickness below 1 nanometer. In this paper, we present a systematic micromagnetic modeling analysis regarding the effect of spatially random intergranular exchange coupling due to the variation in grain boundary thickness. As oxide boundary becomes sufficiently thin in small grain size media, a distribution in the grain boundary thickness is found to cost significant SNR loss according to simulation results.
  • Keywords
    exchange interactions (electron); grain size; micromagnetics; noise; perpendicular magnetic recording; grain size; intergranular exchange coupling; noise mechanism; oxide grain boundary; perpendicular thin film media; systematic micromagnetic modeling; Costs; Couplings; Grain boundaries; Grain size; Magnetic heads; Micromagnetics; Perpendicular magnetic recording; Signal to noise ratio; Transistors; USA Councils; Intergranular exchange coupling; perpendicular magnetic recording; signal-to-noise ratio (SNR);
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2010.2040070
  • Filename
    5467390