A new generation of scanning probe technology

Author

Stevens, Ramsey M.

Author_Institution

Univ. of California at Santa Barbara, Santa Barbara, CA, USA

Volume

3

Issue

4

fYear

2009

fDate

12/1/2009 12:00:00 AM

Firstpage

10

Lastpage

13

Abstract

Scanning probe microscopy (SPM) analysis of materials is reliant upon direct physical interaction between a scanning probe and a sample surface. This physical interaction provides a range of analysis and surface modification techniques that are unique in microscopy and offers particular advantages and limitations. Precise computer-controlled positioning capabilities of SPM instrumentation continues to improve and is being combined with new nanoengineered probe types to achieve long-sought nanotechnology goals and minimize some of the traditional limitations of scanning probe technology.

Keywords

scanning probe microscopy; SPM instrumentation; computer-controlled positioning capabilities; direct physical interaction; nanoengineered probe types; nanotechnology goals; sample surface; scanning probe microscopy; scanning probe technology; surface modification techniques; Biological materials; Carbon nanotubes; Chemical technology; Force measurement; Instruments; Material properties; Nanotechnology; Scanning probe microscopy; Shape; Silicon;

fLanguage

English

Journal_Title

Nanotechnology Magazine, IEEE

Publisher

ieee

ISSN

1932-4510

Type

jour

DOI

10.1109/MNANO.2009.934862

Filename

5284481