Software-based analysis of radio frequency plasma display panel for efficient design and impedance matching

Author

Kim, Ki Hyuk ; Park, H.I. ; Park, J.H. ; Hwang, Sung Woo ; Kang, J.

Author_Institution

Sch. of Electr. Eng., Korea Univ., Seoul, South Korea

Volume

24

Issue

2

fYear

2001

fDate

6/1/2001 12:00:00 AM

Firstpage

279

Lastpage

284

Abstract

A full software analysis technique for the radio frequency (RF) plasma display panel (PDP) has been developed. The RF PDP test panel has been analyzed by the segmentation/three-dimensional (3-D) parameter extraction/SPICE simulation scheme, which was originally developed for the analysis of RF complimentary metal oxide semiconductor (CMOS) chips. Our technique is shown to be accurate in predicting the input impedance of the RF port and the calculated input impedance is used to perform impedance matching of the system. The technique is also extendable to a much larger size RF-PDP and has the possibility of being applied to the design and analysis of various interesting RF systems and components

Keywords

SPICE; impedance matching; parameter estimation; plasma displays; 3D parameter extraction; RF PDP; SPICE simulation scheme; impedance matching; input impedance; radio frequency plasma display panel; segmentation; software-based analysis; test panel; Analytical models; Electrodes; Flat panel displays; Impedance matching; Plasma displays; Plasma materials processing; RF signals; Radio frequency; SPICE; TV;

fLanguage

English

Journal_Title

Components and Packaging Technologies, IEEE Transactions on

Publisher

ieee

ISSN

1521-3331

Type

jour

DOI

10.1109/6144.926394

Filename

926394