Title :
Characterization of Oxide Materials for Exchange Decoupling in Perpendicular Thin Film Media
Author :
Sokalski, Vincent M. ; Zhu, Jian-Gang ; Laughlin, David E.
Author_Institution :
Dept. of Mater. Sci. & Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
6/1/2010 12:00:00 AM
Abstract :
We report on continued measurements using an experimental model system to quantify intergranular exchange coupling in CoCrPt-oxide perpendicular magnetic recording media. A thin film multi-layered structure comprising a high coercivity CoPt unicrystal layer separated from a low coercivity CoPt layer by a thin oxide interlayer is used to model the vertically aligned grains separated by oxide boundaries in CoCrPt-oxide media. Exchange coupling is measured by field shifts of the minor loop from the low coercivity layer. Results on coupling energy as a function of interlayer thickness are presented for several different oxides. Additional measurements are presented to understand the possible role of the added alloying elements, Cr and Mn, to the magnetic grains in terms of intergranular exchange coupling.
Keywords :
chromium alloys; cobalt alloys; coercive force; exchange interactions (electron); magnesium compounds; magnetic multilayers; magnetic recording; magnetic thin films; platinum alloys; CoCrPt-MgO; alloying elements; coupling energy; field shifts; high coercivity unicrystal layer; intergranular exchange coupling; interlayer thickness; low coercivity layer; magnetic grains; oxide material characterization; oxide perpendicular magnetic recording media; perpendicular thin film media; thin film multilayered structure; Chromium; Coercive force; Couplings; Magnetic films; Magnetic materials; Magnetic separation; Perpendicular magnetic recording; Sputtering; Transistors; X-ray diffraction; Intergranular exchange coupling; perpendicular magnetic recording;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2010.2040814