Title :
Burst error generator using flip-flop metastability
Author :
Kulkarni, G. ; Naware, V. ; Govindarajan, M.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol., Bombay, India
fDate :
1/21/1999 12:00:00 AM
Abstract :
A novel burst error generator for communications systems testing is presented which is based on the phenomenon of metastability observed in flip-flops. Bursts can be created with predetermined bit error ratios by means of an external control voltage. The errors appear to follow a double Poisson distribution, characteristic of the Neyman type A contagious process
Keywords :
Poisson distribution; digital communication; error correction codes; flip-flops; telecommunication equipment testing; Neyman type A contagious process; burst error generator; communications systems testing; double Poisson distribution; external control voltage; flip-flop metastability; predetermined bit error ratios;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19990108
