Method for critical current testing: software corrections

Author

Siddall, M.B. ; Smathers, D.B.

Author_Institution

Teledyne Wah Chang Albany, Albany, OR, USA

Volume

25

Issue

2

fYear

1989

fDate

3/1/1989 12:00:00 AM

Firstpage

1823

Lastpage

1826

Abstract

A digital method for accumulating critical current date allows the test to be automated. Digital techniques provide the opportunity to make corrections for self field, protection shunt, and transient voltages which are not feasible with an analog system. Automation also allows rapid data analysis to inspect the test for bad data. The digital current incrementing method deviates from the ASTM test method, but the authors´ measurements on the NbTi SRM and the Japan-US B sample from round robin testing show it to be accurate to within the limits set by ASTM

Keywords

automatic test equipment; critical currents; electric current measurement; ASTM test method; Japan-US B sample; NbTi; SRM; Standard Reference Material; accumulating critical current date; critical current testing; digital current incrementing method; digital method; protection shunt; rapid data analysis; round robin testing; self field; software corrections; transient voltages; Automatic testing; Automation; Critical current; Current measurement; Data analysis; Niobium compounds; Protection; Software testing; Titanium compounds; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.92657

Filename

92657