Title :
Method for critical current testing: software corrections
Author :
Siddall, M.B. ; Smathers, D.B.
Author_Institution :
Teledyne Wah Chang Albany, Albany, OR, USA
fDate :
3/1/1989 12:00:00 AM
Abstract :
A digital method for accumulating critical current date allows the test to be automated. Digital techniques provide the opportunity to make corrections for self field, protection shunt, and transient voltages which are not feasible with an analog system. Automation also allows rapid data analysis to inspect the test for bad data. The digital current incrementing method deviates from the ASTM test method, but the authors´ measurements on the NbTi SRM and the Japan-US B sample from round robin testing show it to be accurate to within the limits set by ASTM
Keywords :
automatic test equipment; critical currents; electric current measurement; ASTM test method; Japan-US B sample; NbTi; SRM; Standard Reference Material; accumulating critical current date; critical current testing; digital current incrementing method; digital method; protection shunt; rapid data analysis; round robin testing; self field; software corrections; transient voltages; Automatic testing; Automation; Critical current; Current measurement; Data analysis; Niobium compounds; Protection; Software testing; Titanium compounds; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
