• DocumentCode
    1498661
  • Title

    The effect of transverse stress on the critical current of Nb3 Sn cable-in-conduit superconductors

  • Author

    Summers, L.T. ; Miller, J.R.

  • Author_Institution
    Lawrence Livermore Nat. Lab., CA, USA
  • Volume
    25
  • Issue
    2
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    1835
  • Lastpage
    1838
  • Abstract
    An investigation has been conducted of the effects of transverse stress on the critical current of Nb3Sn cable-in-conduit conductors (CICC). The sensitivity of the critical current (I c) to applied stress at 12 T has been determined for CICCs with helium void fractions (fHe) in the range of 0.25-0.4. Ic has been found to be a function of transverse stress with good correlation with single-wire data up to stress levels of 50 MPa. At higher stress levels with the CICCs show significantly higher degradation with transverse stress. No clear correlation has been found between the stress sensitivity of I c and fHe. The results fall into a broadband, suggesting that geometric factors, such as wire position within the cable bundle, exert a strong influence on the Ic vs. stress dependence
  • Keywords
    critical currents; niobium alloys; superconducting cables; tin alloys; 12 T; CICC; He void fraction; Nb3Sn; applied stress; cable-in-conduit superconductors; critical current; degradation; effect of transverse stress; geometric factors; sensitivity; single-wire data; stress dependence; stress levels; stress sensitivity; wire position; Conductors; Critical current; Multifilamentary superconductors; Niobium; Residual stresses; Superconducting cables; Superconducting magnets; Thermal stresses; Tin; Wire;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.92660
  • Filename
    92660