• DocumentCode
    1498754
  • Title

    Magnetic Properties of Exchange-Biased [{\\rm Co/Pt}]_{\\rm n} Multilayer With Perpendicular Magnetic Anisotropy

  • Author

    Chen, Jun-Yang ; Feng, Jia-Feng ; Diao, Zhu ; Feng, Gen ; Coey, J.M.D. ; Han, Xiu-Feng

  • Author_Institution
    Sch. of Phys., Trinity Coll., Dublin, Ireland
  • Volume
    46
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    1401
  • Lastpage
    1404
  • Abstract
    Perpendicular exchange-biased [Co/Pt]3/Co(tCo)/IrMn andIrMn/Co(tCo)/Pt/[Co/Pt]3 multilayers have been fabricated, changing the thickness (tCo) of the cobalt that is next to the IrMn layer. The crystal structure, interface roughness and magnetic properties were characterized by X-ray diffraction (XRD), X-ray reflectivity (XRR), atomic force microscopy (AFM) and extraordinary Hall Effect (EHE). The multilayers are flat, and the roughness is about 0.2 nm across the 2-¿m scanning range. The magnetization reversal is dependent on tCo, and the exchange bias and coercivity vary with tCo. The exchange bias reaches a maximum value (about 13.9 mT) for top-pinned multilayers at tCo = 0.45 nm, while it reaches a maximum (about 3.5 mT) for bottom-pinned multilayers at tCo = 0.6 nm. For both stacks the coercivity is maximum (about 30 mT) at tCo = 0.8 nm, and stable for tCo > 1.0 nm. These results are well understood in terms of the Co spin orientation at the Co/IrMn interface.
  • Keywords
    Hall effect; X-ray diffraction; atomic force microscopy; cobalt alloys; iridium alloys; magnetic multilayers; magnetisation reversal; manganese alloys; perpendicular magnetic anisotropy; platinum alloys; CoPt-Co-IrMn; X-ray diffraction; X-ray reflectivity; atomic force microscopy; coercivity; crystal structure; exchange bias; extraordinary Hall Effect; interface roughness; magnetic properties; magnetization reversal; perpendicular exchange-biased multilayer; perpendicular magnetic anisotropy; spin orientation; Atomic force microscopy; Atomic layer deposition; Cobalt; Coercive force; Magnetic force microscopy; Magnetic multilayers; Magnetic properties; Reflectivity; X-ray diffraction; X-ray scattering; $[{rm Co/Pt}]_{rm n}$ perpendicular multilayers; magnetization reversal;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2010.2041192
  • Filename
    5467500