• DocumentCode
    1498771
  • Title

    Spin-Flipping Associated With the Antiferromagnet IrMn

  • Author

    Acharyya, Rakhi ; Nguyen, Hoang Yen Thi ; Pratt, W.P., Jr. ; Bass, Jack

  • Author_Institution
    Dept. of Phys. & Astron., Michigan State Univ., East Lansing, MI, USA
  • Volume
    46
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    1454
  • Lastpage
    1456
  • Abstract
    We have used current-perpendicular-to-plane magnetoresistance measurements of Py-based exchange-biased spin-valves containing IrMn inserts of thickness t to estimate the spin-flipping probability of the antiferromagnet IrMn. From t=0 to t= 1 nm, we find a rapid decrease in A¿R=A(RAP - RP) , by about a factor of 50-here A is the area through which the CPP current flows, and RAP and RP are the resistances with the moments of the two Py layers oriented anti-parallel (AP) or parallel (P) to each other. We attribute this decrease to very strong spin-flipping in the IrMn/Cu interfacial region, with effective spin diffusion length l sf IrMn/Cu= 0.24 nm, only about 1 monolayer (ML). But for t from 2 to 5 nm, the decrease of A¿R with increasing IrMn thickness is much slower. The reason for this slowing is not yet clear.
  • Keywords
    antiferromagnetic materials; copper; exchange interactions (electron); iridium alloys; magnetic moments; magnetic multilayers; manganese alloys; spin dynamics; spin valves; IrMn-Cu; antiferromagnet; current-perpendicular-to-plane magnetoresistance measurements; exchange-biased spin-valves; interfacial region; moments; monolayer; size 0 nm to 1 nm; spin diffusion length; spin-flipping probability; Antiferromagnetic materials; Current measurement; Extraterrestrial measurements; Magnetoresistance; Niobium; Sputtering; Strips; Superconducting epitaxial layers; Temperature; Thickness measurement; Antiferromagnet; IrMn; IrMn/Cu interface; spin-flipping in IrMn;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2010.2045348
  • Filename
    5467503