Title :
A Simple Model for Capture and Emission Time Constants of Random Telegraph Signal Noise
Author :
Son, Younghwan ; Kang, Taewook ; Park, Sunyoung ; Shin, Hyungcheol
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
Abstract :
A simple model for electron capture and emission process in oxide traps is introduced for analysis of random telegraph signal noise. Multiphonon emission capture theory is used for a “more fundamental” thermally activated capture cross-sectional model. Basically, Shockley-Read-Hall statistics is considered for time constant modeling. Particularly, the thermally activation model with the quantum effect is applied to emission time constant modeling. It is shown that the capture and emission process are controlled by characteristics of traps. Especially, the physical meaning of the lattice relaxation energy which is the most important model parameter and the trap characteristic is clarified.
Keywords :
electron emission; phonon-phonon interactions; random noise; Shockley-Read-Hall statistics; capture time constant; electron emission process; emission time constant; lattice relaxation energy; multiphonon emission capture theory; oxide traps; quantum effect; random telegraph signal noise; thermally activated capture cross-sectional model; Biological system modeling; Electron traps; Logic gates; Mathematical model; Noise measurement; Voltage measurement; Capture; capture cross section; emission; noise; oxide trap; random telegraph signal (RTS); time constant modeling;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2011.2142401