• DocumentCode
    1498850
  • Title

    Short-cavity edge-emitting lasers with deeply etched distributed Bragg mirrors

  • Author

    Höfling, E. ; Werner, R. ; Schäfer, F. ; Reithmaier, J.P. ; Forchel, A.

  • Author_Institution
    Tech. Phys., Wurzburg Univ., Germany
  • Volume
    35
  • Issue
    2
  • fYear
    1999
  • fDate
    1/21/1999 12:00:00 AM
  • Firstpage
    154
  • Lastpage
    155
  • Abstract
    Short-cavity edge-emitting lasers with deeply etched distributed Bragg reflectors (DBRs) of third and second order were realised by reactive ion etching on GaInAs/AlGaAs layer structures. Diffraction limited reflectivities were achieved for third order dry etched DBR mirrors. Devices with DBRs on both cavity ends allow lasing operation for cavity lengths as short as 40 μm
  • Keywords
    III-V semiconductors; aluminium compounds; distributed Bragg reflector lasers; gallium arsenide; indium compounds; laser cavity resonators; laser mirrors; semiconductor lasers; sputter etching; 40 micron; GaInAs-AlGaAs; diffraction limited reflectivity; distributed Bragg mirror; dry etching; reactive ion etching; short-cavity edge-emitting laser;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19990133
  • Filename
    758029