DocumentCode :
1498892
Title :
Front-End ASIC for a Liquid Argon TPC
Author :
De Geronimo, Gianluigi ; D´Andragora, Alessio ; Li, Shaorui ; Nambiar, Neena ; Rescia, Sergio ; Vernon, Emerson ; Chen, Hucheng ; Lanni, Francesco ; Makowiecki, Don ; Radeka, Veljko ; Thorn, Craig ; Yu, Bo
Author_Institution :
Brookhaven Nat. Lab., Upton, NY, USA
Volume :
58
Issue :
3
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
1376
Lastpage :
1385
Abstract :
We present a front-end application-specific integrated circuit (ASIC) for a wire based time-projection-chamber (TPC) operating in liquid Argon (LAr). The LAr TPC will be used for long baseline neutrino oscillation experiments. The ASIC must provide a low-noise readout of the signals induced on the TPC wires, digitization of those signals at 2 MSamples/s, compression, buffering and multiplexing. A resolution of better than 1000 rms electrons at 200 pF input capacitance for an input range of 300 fC is required, along with low power and operation in LAr (at 87 K). We include the characterization of a commercial technology for operation in the cryogenic environment and the first experimental results on the analog front end. The results demonstrate that complementary metal-oxide semiconductor transistors have lower noise and much improved dc characteristics at LAr temperature. Finally, we introduce the concept of “1/f equivalent” to model the low-frequency component of the noise spectral density, for use in the input metal-oxide semiconductor field-effect transistor optimization.
Keywords :
MOSFET; application specific integrated circuits; neutrino oscillations; readout electronics; time projection chambers; TPC wires; application-specific integrated circuit; front-end ASIC; liquid argon; low-frequency component; low-noise readout; metal-oxide semiconductor field-effect transistor optimization; neutrino oscillation experiment; noise spectral density; time-projection-chamber; Application specific integrated circuits; Capacitance; Current measurement; MOSFET circuits; Noise; Wire; Analog-to-digital converter (ADC); application-specific integrated circuit (ASIC); cryogenic; noise;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2011.2127487
Filename :
5752881
Link To Document :
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