Title :
TID in Flash-Based FPGA: Power Supply-Current Rise and Logic Function Mapping Effects in Propagation-Delay Degradation
Author :
Kastensmidt, Fernanda Lima ; Fonseca, Evaldo Carlos Pereira ; Vaz, Rafael Galhardo ; Gonçalez, Odair Lelis ; Chipana, Raul ; Wirth, Gilson Inácio
Author_Institution :
Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Abstract :
We exposed a flash-based FPGA to radiation to measure variations in current, temperature, propagation-delay and duty-cycle in logic circuits. Propagation-delay degradations vary from 400% to 1100% before functional failure, according to circuit and logical mapping. Electrical simulations are carried out to study the difference of behavior in the degradation of different logic mappings.
Keywords :
field programmable gate arrays; logic circuits; duty-cycle; electrical simulation; flash-Based FPGA; logic circuits; logic function mapping effects; logical mapping; power supply-current rise; propagation-delay degradation; Degradation; Field programmable gate arrays; Inverters; Logic gates; Radiation effects; Temperature measurement; Transistors; Flash-based FPGA; propagation-delay degradation; radiation effects; total ionizing dose (TID);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2128881
