DocumentCode
1498906
Title
TID in Flash-Based FPGA: Power Supply-Current Rise and Logic Function Mapping Effects in Propagation-Delay Degradation
Author
Kastensmidt, Fernanda Lima ; Fonseca, Evaldo Carlos Pereira ; Vaz, Rafael Galhardo ; Gonçalez, Odair Lelis ; Chipana, Raul ; Wirth, Gilson Inácio
Author_Institution
Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Volume
58
Issue
4
fYear
2011
Firstpage
1927
Lastpage
1934
Abstract
We exposed a flash-based FPGA to radiation to measure variations in current, temperature, propagation-delay and duty-cycle in logic circuits. Propagation-delay degradations vary from 400% to 1100% before functional failure, according to circuit and logical mapping. Electrical simulations are carried out to study the difference of behavior in the degradation of different logic mappings.
Keywords
field programmable gate arrays; logic circuits; duty-cycle; electrical simulation; flash-Based FPGA; logic circuits; logic function mapping effects; logical mapping; power supply-current rise; propagation-delay degradation; Degradation; Field programmable gate arrays; Inverters; Logic gates; Radiation effects; Temperature measurement; Transistors; Flash-based FPGA; propagation-delay degradation; radiation effects; total ionizing dose (TID);
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2011.2128881
Filename
5752883
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