DocumentCode :
1498939
Title :
Influence of Intermediate Layer on Magnetic Properties of 
Author :
Li, Xu ; Li, Zhenghua ; Liu, Xi ; Li, Yanbo ; Bai, Jianmin ; Wei, Fulin ; Wei, Dan
Author_Institution :
Key Lab. for Magn. & Magn. Mater. of the Minist. of Educ., Lanzhou Univ., Lanzhou, China
Volume :
46
Issue :
6
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
2024
Lastpage :
2027
Abstract :
The L10 ordered FePt thin films have been prepared by magnetron sputtering system on Cr85W15 underlayer at 500°C of substrate temperature. A 3 nm Pt or W thin interlayer was employed to modulate the magnetic properties of FePt films. The crystallographic relationship between the FePt thin film and the CrW underlayer was studied, and the dependence of FePt films structure and magnetic properties on the Pt or W interlayer was investigated. The M-H loop of the FePt films with Pt or W interlayer was analyzed by using a three-dimensional (3-D) micromagnetic model, with careful discussions of the tetragonal symmetry and the magneto-elastic anisotropy due to the stress in the film plane. The stress state in the films and its effect on magnetic properties were discussed.
Keywords :
crystal symmetry; ferromagnetic materials; internal stresses; iron alloys; magnetic anisotropy; magnetic thin films; magnetoelastic effects; micromagnetics; perpendicular magnetic recording; platinum alloys; sputter deposition; stress effects; Cr85W15; FePt; L10 ordered perpendicular recording media; L10 ordered thin films; intermediate layer; magnetic properties; magnetoelastic anisotropy; magnetron sputtering; stress state; temperature 500 degC; tetragonal symmetry; thin interlayer; three-dimensional micromagnetic model; Chromium; Magnetic anisotropy; Magnetic films; Magnetic modulators; Magnetic properties; Perpendicular magnetic anisotropy; Sputtering; Stress; Substrates; Temperature; CrW underlayer; FePt film; interlayer; magnetostriction; micromagnetic method;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2010.2041052
Filename :
5467525
Link To Document :
