Title :
Characterization of underfill materials for functional solder bumped flip chips on board applications
Author :
Lan, J.H. ; Chang, Chris
Author_Institution :
Express Packaging Syst. Inc., Palo Alto, CA, USA
fDate :
3/1/1999 12:00:00 AM
Abstract :
The curing conditions and material properties such as the TCE (thermal coefficient of expansion), Tg (glass transition temperature), flexural storage modulus, tangent delta, and moisture content of nine different underfill materials from three different vendors are measured. Their flow rate and the effect of moisture content on mechanical (shear) strength in solder bumped flip chips on organic substrate are also determined experimentally. Furthermore, their effects on the electrical performance (voltage) of functional flip chip devices on organic substrate are measured. Finally, a simple methodology is presented for the selection of underfills from the measurement results of these nine different underfill materials
Keywords :
chip-on-board packaging; elastic moduli; encapsulation; flip-chip devices; glass transition; moisture; shear strength; soldering; thermal expansion; curing; epoxy encapsulant; flexural storage modulus; flow rate; glass transition temperature; mechanical shear strength; moisture content; organic substrate; solder bumped flip chip on board; tangent delta; thermal coefficient of expansion; underfill material; Curing; Flip chip; Glass; Material properties; Material storage; Moisture measurement; Semiconductor device measurement; Temperature; Thermal expansion; Voltage;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/6144.759360