• DocumentCode
    1500178
  • Title

    Measurement and correlation of optical and TEM twins in Y1 Ba2Cu3O7-δ

  • Author

    Chumbley, L.S. ; Verhoeven, J.D. ; Kim, M.R. ; Cornelius, A.L. ; Kramer, M.J.

  • Author_Institution
    Iowa State Univ., Ames, IA, USA
  • Volume
    25
  • Issue
    2
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    2337
  • Lastpage
    2340
  • Abstract
    The spacing of the twins present in Y1Ba2Cu 3O7-δ has been investigated using optical and transmission electron microscopy (TEM). Studies have reported that the value of the average twin spacing obtained by optical measurements is much larger than that measured in thin foils prepared for TEM observation, and controversy exists as to the exact nature of the optical twins. Experiments have been conducted which show that the twins observed optically correspond to those seen using TEM and are not produced by an optical interference effect. Using electron channeling, equations have been formulated which allow optical determination of the true spacing of twins present in a selected grain as well as the orientation of that grain. The average twin spacing measured by TEM has been found to vary with the sample preparation method, being smaller for crushed chip samples than for bulk samples prepared by ion milling or jet-polishing. A variation of the twin spacing with grain size has also been noted
  • Keywords
    barium compounds; channelling; electron beam effects; grain size; high-temperature superconductors; optical properties of substances; transmission electron microscope examination of materials; twinning; yttrium compounds; TEM twins; Y1Ba2Cu3O7-δ; average twin spacing; electron channeling; grain orientation; grain size; high temperature superconductor; optical measurements; optical twins; thin foils; transmission electron microscopy; Electron optics; High temperature superconductors; Interference; Milling; Optical microscopy; Particle beam optics; Powders; Scanning electron microscopy; Superconducting transition temperature; Transmission electron microscopy;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.92777
  • Filename
    92777