Investigation of the multilayer deposited BiSrCaCuO thin films

Author

Jie, B.B. ; Wang, S.L. ; Bao, Z.L. ; Wang, F.R. ; Li, C.Y. ; Li, G. ; Wang, S.Z. ; Yin, D.L.

Author_Institution

Peking Univ., Beijing, China

Volume

25

Issue

2

fYear

1989

fDate

3/1/1989 12:00:00 AM

Firstpage

2448

Lastpage

2450

Abstract

Superconducting BiSrCaCuO thin films with zero resistivity at 80 K have been prepared by a multilayer deposition and diffusion method. The nominal composition is BiSrCaCu₂O_y. X-ray diffraction shows that the same lattice structure as for the bulk material but with strong preferred orientation in the film. The superconductivity of this kind of film is sensitive to treatment temperature but not sensitive to annealing atmosphere. Critical parameters have been measured and compared with the similar YBaCuO thin films

Keywords

X-ray diffraction examination of materials; annealing; bismuth compounds; calcium compounds; crystal orientation; high-temperature superconductors; strontium compounds; superconducting thin films; superconducting transition temperature; vapour deposition; 80 K; BiSrCaCuO; X-ray diffraction; annealing atmosphere; critical parameters; diffusion method; high temperature superconductor; lattice structure; multilayer deposited BiSrCaCuO thin films; nominal composition; strong preferred orientation; treatment temperature; zero resistivity; Conductivity; Lattices; Nonhomogeneous media; Sputtering; Superconducting films; Superconducting materials; Superconducting thin films; Superconductivity; Temperature sensors; X-ray diffraction;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.92802

Filename

92802