• DocumentCode
    1500821
  • Title

    Light Extraction Enhancement of GaN-Based Light-Emitting Diodes Using Crown-Shaped Patterned Sapphire Substrates

  • Author

    Chiu, Ching-Hsueh ; Hsu, Lung-Hsing ; Lee, Chia-Yu ; Lin, Chien-Chung ; Lin, Bo-Wen ; Tu, Shang-Ju ; Chen, Yan-Hao ; Liu, Che-Yu ; Hsu, Wen-Ching ; Lan, Yu-Pin ; Sheu, Jinn-Kong ; Lu, Tien-Chang ; Chi, Gou-Chung ; Kuo, Hao-Chung ; Wang, Shing-Chung ; Chan

  • Author_Institution
    Dept. of Photonics, Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    24
  • Issue
    14
  • fYear
    2012
  • fDate
    7/15/2012 12:00:00 AM
  • Firstpage
    1212
  • Lastpage
    1214
  • Abstract
    In this letter, we report the high performance GaN-based light-emitting diodes (LEDs) with embedded air void array grown by metal-organic chemical vapor deposition. The donut-shaped air void was formed at the interface between crown-shaped patterned sapphire substrates (CPSS) and the GaN epilayer by conventional photolithography. The transmission electron microscopy images demonstrate that the threading dislocations were significantly suppressed by epitaxial lateral overgrowth (ELOG). The Monte Carlo ray-tracing simulation reveals that the light extraction of the air-voids embedded LED was dramatically increased due to a strong light reflection and redirection by the air voids.
  • Keywords
    III-V semiconductors; MOCVD; Monte Carlo methods; dislocations; gallium compounds; light emitting diodes; photolithography; ray tracing; sapphire; semiconductor epitaxial layers; transmission electron microscopy; wide band gap semiconductors; Al2O3; GaN; GaN epilayer; GaN-based light-emitting diodes; Monte Carlo ray-tracing; crown-shaped patterned sapphire substrates; donut-shaped air void; embedded air void array; epitaxial lateral overgrowth; light extraction enhancement; metal-organic chemical vapor deposition; photolithography; threading dislocations; transmission electron microscopy images; Epitaxial growth; Gallium nitride; Light emitting diodes; Optical variables control; Photonics; Substrates; Temperature measurement; Epitaxial lateral overgrowth; light-emitting diodes; metal–organic chemical vapor deposition;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2012.2195779
  • Filename
    6188511