Title :
Microstructural characterization of YBa2Cu3O 7-δ thin films on SrTiO3 using four-axis X-ray diffraction
Author :
Sizemore, J. ; Barton, R. ; Marshall, A. ; Bravman, J.C. ; Naito, M. ; Char, K.
Author_Institution :
Dept. of Mater. Sci. & Eng., Stanford Univ., CA, USA
fDate :
3/1/1989 12:00:00 AM
Abstract :
Microstructural characteristics of YBa2Cu3O 7-δ thin films on SrTiO3 have an important influence on their physical properties. Four-axis X-ray diffraction methods have been used to characterize textured and nontextured phases in several YBa2Cu3O7-δ thin films deposited on single-crystal SrTiO3. The type of epitaxial orientation of a- and c-axis textured films has been analyzed by tilting the specimen and observing the distribution of YBa2Cu3 O7-δ {102} plane X-ray intensities over 95% of the reciprocal lattice hemisphere. The ratio of a- to c-axis material was determined. Several films were found to contain nonepitaxially oriented YBa2Cu3O7-δ, Y2 BaCuO5, and BaCuO2. Methods for quantifying the amounts of these random phases are discussed. The existence of stacking faults, such as those caused by the presence of extra Cu-O planes in YBa2Cu3O7-δ, can sometimes manifest itself as a broadening and shifting of diffraction peaks. Consistent with the X-ray data, the stacking faults are readily seen in high-resolution electron microscopy images
Keywords :
X-ray diffraction examination of materials; barium compounds; crystal microstructure; electron microscope examination of materials; high-temperature superconductors; stacking faults; superconducting thin films; texture; yttrium compounds; YBa2Cu3O7-δ; epitaxial orientation; four-axis X-ray diffraction; high temperature superconductors; high-resolution electron microscopy; stacking faults; textured films; thin films; Anodes; Detectors; Epitaxial growth; Microstructure; Optical films; Optical reflection; Substrates; Superconducting thin films; Transistors; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
