DocumentCode :
1500972
Title :
Enhanced Visual Analysis for Cluster Tendency Assessment and Data Partitioning
Author :
Wang, Liang ; Geng, Xin ; Bezdek, James ; Leckie, Christopher ; Kotagiri, Ramamohanarao
Author_Institution :
Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
Volume :
22
Issue :
10
fYear :
2010
Firstpage :
1401
Lastpage :
1414
Abstract :
Visual methods have been widely studied and used in data cluster analysis. Given a pairwise dissimilarity matrix D of a set of n objects, visual methods such as the VAT algorithm generally represent D as an n × n image I(D̃) where the objects are reordered to reveal hidden cluster structure as dark blocks along the diagonal of the image. A major limitation of such methods is their inability to highlight cluster structure when D contains highly complex clusters. This paper addresses this limitation by proposing a Spectral VAT algorithm, where D is mapped to D´ in a graph embedding space and then reordered to D̃´ using the VAT algorithm. A strategy for automatic determination of the number of clusters in I(D̃´) is then proposed, as well as a visual method for cluster formation from I(D̃´) based on the difference between diagonal blocks and off-diagonal blocks. A sampling-based extended scheme is also proposed to enable visual cluster analysis for large data sets. Extensive experimental results on several synthetic and real-world data sets validate our algorithms.
Keywords :
data analysis; data visualisation; matrix algebra; pattern clustering; sampling methods; automatic determination; cluster tendency assessment; data cluster analysis; data partitioning; enhanced visual analysis; graph embedding space; hidden cluster structure; pairwise dissimilarity matrix; sampling based extended scheme; spectral VAT algorithm; Clustering algorithms; Computer science; Data analysis; Data mining; Data structures; Marine animals; Partitioning algorithms; Software engineering; Software measurement; Taxonomy; Clustering; VAT; cluster tendency; out-of-sample extension.; spectral embedding;
fLanguage :
English
Journal_Title :
Knowledge and Data Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
1041-4347
Type :
jour
DOI :
10.1109/TKDE.2009.192
Filename :
5288527
Link To Document :
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