DocumentCode :
1501027
Title :
A 1-GHz logic circuit family with sense amplifiers
Author :
Takahashi, O. ; Aoki, N. ; Silberman, J. ; Dhong, S.
Author_Institution :
Res. Div., IBM Austin Res. Lab., TX, USA
Volume :
34
Issue :
5
fYear :
1999
fDate :
5/1/1999 12:00:00 AM
Firstpage :
616
Lastpage :
622
Abstract :
This paper describes a newly developed logic circuit family based on dual-rail bit lines and sense amplifiers that is used extensively in a 1.0-GHz, single-issue, 64-bit PowerPC integer processor, gigahertz unit test site (guTS). The family consists of an incrementor, a count-leading-zero, a rotator, and a read-only memory. Each macro consists of a leaf-cell array, dual-rail bit lines, a row of sense amplifiers, a control block, and peripheral circuits. A common read-out scheme sensing the differential voltage of dual-rail bit lines is used. The hardware was fabricated in a 0.25-μm drawn channel length, six-metal-layer (Al) CMOS technology (1.8-V nominal VDD). Wafer testing was performed using a probe card. The macros were tested cycle by cycle by scanning the input data to the read/write address latches and data latches, and scanning the result out from the output receiving latches. Functional testing was performed on guTS macros at frequencies up to 1.0 GHz at 25°C with nominal VDD (1.1 GHz for the ROM)
Keywords :
CMOS digital integrated circuits; cellular arrays; high-speed integrated circuits; integrated circuit testing; microprocessor chips; read-only storage; 0.25 micron; 1 GHz; 1.8 V; 25 degC; 64 bit; CMOS technology; PowerPC integer processor; common read-out scheme; count-leading-zero; dual-rail bit lines; functional testing; gigahertz unit test site; incrementor; leaf-cell array; logic circuit family; output receiving latches; probe card; read-only memory; rotator; sense amplifiers; wafer testing; CMOS technology; Circuit testing; Hardware; Latches; Logic circuits; Logic testing; Performance evaluation; Power amplifiers; Probes; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.760371
Filename :
760371
Link To Document :
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