DocumentCode :
1501072
Title :
Fast Computation of Discharge Current Upper Bounds for Clustered Power Gating
Author :
Sathanur, Ashoka ; Benini, Luca ; Macii, Alberto ; Macii, Enrico ; Poncino, Massimo
Author_Institution :
Dipt. di Autom. e Inf. (DAUIN), Politec. di Torino, Torino, Italy
Volume :
19
Issue :
1
fYear :
2011
Firstpage :
146
Lastpage :
151
Abstract :
The capability of accurately estimating an upper bound of the maximum current drawn by a digital macroblock from the ground or power supply line constitutes a major asset of automatic power-gating flows. In fact, the maximum current information is essential to properly size the sleep transistor in such a way that speed degradation and signal integrity violations are avoided. Loose upper bounds can be determined with a reasonable computational cost, but they lead to oversized sleep transistors. On the other hand, exact computation of the maximum drawn current is an NP-hard problem, even when conservative simplifying assumptions are made on gate-level current profiles. In this paper, we present a scalable algorithm for tightening upper bound computation, with a controlled and tunable computational cost. The algorithm exploits state-of-the-art commercial timing analysis engines, and it is tightly integrated into an industrial power-gating flow for leakage power reduction. The results we have obtained on large circuits demonstrate the scalability and effectiveness of our estimation approach.
Keywords :
CMOS integrated circuits; optimisation; power supply circuits; NP-hard problem; automatic power gating; clustered power gating; digital macroblock; discharge current upper bounds; ground; power supply line; Algorithm design and analysis; Computational efficiency; Degradation; Engines; NP-hard problem; Power supplies; Sleep; Timing; Tunable circuits and devices; Upper bound; Leakage power optimization; low power design; maximum current estimation;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2009.2029276
Filename :
5288542
Link To Document :
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