• DocumentCode
    1501452
  • Title

    Sensitivity analysis of neocognitron

  • Author

    Cheng, Antony Y. ; Yeung, Daniel S.

  • Author_Institution
    Dept. of Comput., Hong Kong Polytech. Univ., Hung Hom, Hong Kong
  • Volume
    29
  • Issue
    2
  • fYear
    1999
  • fDate
    5/1/1999 12:00:00 AM
  • Firstpage
    238
  • Lastpage
    249
  • Abstract
    Fukushima´s (1988; 1989; 1992; 1993) neocognitron model is well-known for its performance in visual pattern recognition. Through a training process, the visual pattern information is stored in a form of numerical weights in memory. When the model is actually implemented in hardware, weight errors and input noises caused by hardware imprecision and imperfect input devices respectively cannot be avoided and consequently the recognition performance usually degrades substantially from the theoretical result. In this paper, the effects of weight imprecision and input noise to the recognition performance of neocognitron are studied through a sensitivity analysis of the model. The sensitivity of an S-cell to weight and input perturbations is first derived, as a function of the weight and input perturbation ratios. An algorithm is proposed to combine the sensitivities of the S-cells in different layers to form the overall sensitivity of the model. The established sensitivity measure is then demonstrated to be a useful tool for hardware design. In addition, it has been found that the decision (recognition) error of neocognitron increases with the weight perturbation, the input perturbation, and the number of weights per neuron. This is similar to the result obtained for the Madaline model. Another important result is that decision error increases with the threshold/selectivity parameter. This supports the functional description of the threshold reported by Fukushina
  • Keywords
    learning (artificial intelligence); neural nets; pattern recognition; sensitivity analysis; Madaline model; S-cell; decision error; hardware imprecision; imperfect input devices; input noises; memory; neocognitron; neural networks; numerical weights; performance; perturbations; sensitivity analysis; training; visual pattern recognition; weight errors; Degradation; Fault tolerance; Multilayer perceptrons; Neural network hardware; Neural networks; Neurons; Noise measurement; Pattern recognition; Sensitivity analysis; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Systems, Man, and Cybernetics, Part C: Applications and Reviews, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1094-6977
  • Type

    jour

  • DOI
    10.1109/5326.760568
  • Filename
    760568