DocumentCode :
1501902
Title :
Rules for robust generation of accurate reduced-order models for high-speed coupled interconnections
Author :
Cangellaris, Andreas C. ; Igarashi, Mitsuko
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume :
24
Issue :
2
fYear :
2001
fDate :
5/1/2001 12:00:00 AM
Firstpage :
120
Lastpage :
125
Abstract :
Recently, robust algorithms have been established fur passive order reduction of electrical models of complex interconnection networks. However, very little is known about the way the order of the reduced model should be chosen to ensure accuracy in subsequent transient simulation studies, in this paper, a rule is derived for the selection of the order of the reduced model for interconnections modeled as transmission lines. It is shown that pulse rise time, interconnection length, and physical properties impact the order of the reduced model. The proposed rule is validated through numerical studies involving both analytic and numerical results from the frequency- and time-domain response of multiconductor transmission line circuits
Keywords :
circuit simulation; frequency-domain analysis; high-speed integrated circuits; integrated circuit interconnections; integrated circuit modelling; multiconductor transmission lines; reduced order systems; time-domain analysis; transient analysis; complex interconnection networks; electrical models; frequency-domain response; high-speed coupled interconnections; interconnection length; multiconductor transmission line circuits; physical properties; pulse rise time; reduced-order models; time-domain response; transient simulation studies; Circuit simulation; Computational modeling; Frequency; Function approximation; Integrated circuit interconnections; Power system transients; RLC circuits; Resonance; Robustness; Transmission lines;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/6040.928745
Filename :
928745
Link To Document :
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