DocumentCode :
1502123
Title :
Analysis of tap-changer dynamics and construction of voltage stability regions
Author :
Liu, Chen-Ching ; Vu, Khoi T.
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Volume :
36
Issue :
4
fYear :
1989
fDate :
4/1/1989 12:00:00 AM
Firstpage :
575
Lastpage :
590
Abstract :
The destabilizing behavior of onload tap changers (OLTC) is an important mechanism responsible for the voltage collapse of interconnected power systems. A nonlinear dynamic model of the OLTC, impedance loads and decoupled reactive power-voltage relations is used to reconstruct the voltage-collapse phenomenon. Trajectories leading to a monotonic fall of bus voltages are obtained from initial conditions outside the stability region of a simple power network. The construction of voltage stability regions is desirable for the prevention of voltage collapse. Based on the proposed M-bus power network model, this research results in (1) a simple criterion for stability of an equilibrium, and (2) a method to obtain a stability region by forming the union of hyperbox subsets of the true region. The theoretical foundations of the proposed method, i.e., characteristics of the equilibria and monotonic behaviour of system trajectories, are thoroughly studied
Keywords :
power systems; reactive power; stability; M-bus power network model; bus voltages; decoupled reactive power-voltage relations; destabilizing behavior; hyperbox subsets; impedance loads; interconnected power systems; monotonic behaviour; monotonic fall; nonlinear dynamic model; onload tap changers; power network; stability region; system trajectories; tap-changer dynamics; voltage collapse; voltage stability regions; voltage-collapse phenomenon; Load flow; Power system analysis computing; Power system dynamics; Power system modeling; Power system security; Power system stability; Reactive power; Stability analysis; Stability criteria; Voltage;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/31.92890
Filename :
92890
Link To Document :
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